Picture of Hitachi SU8010 Field-Emission Scanning Electron Microscope (FE-SEM)

Hitachi SU8010 Field-Emission Scanning Electron Microscope (FE-SEM)

About

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Hitachi SU8010 FE SEM.

The Hitachi SU8010 is a semi-in-lens type cold field emission FE-SEM. It offers ultra-high resolution imaging of sample surface, and energy dispersive spectroscopy and backscattered electron detection for compositional information.

This SEM is also capable of correlative light-electron microscopy, enabling researchers to investigate details of their samples with SEM in relation to images/information collected using light microscopy.

Features and specifications

  • Magnification at high magnification mode: 100x-800,000x 
  • Magnification at low magnification mode: 20x-2,000x 
  • Accelerating voltage: 0.5-30kV 
  • Landing voltage in deceleration mode: 0.1-2.0kV 
  • Imaging of surface structure 
  • Detection of backscattered electrons for z-atomic contrast 
  • Energy Dispersive Spectroscopy using the AztecLiveStandard with Ultim Max 170 Detector 

Image examples

varroa-mite
Varroa mite. 
Image: Drs. Sarah Wood and Elemir Simko, WCVM. 
turkey-eye
Cross section of a turkey eye. 
Image: Drs. Marina Leis and Bruce Grahn, WCVM. 
perovskite-sem
SEM image. 
Image: Sajna Simon and Dr. Ian Burgess, USask Dept. of Chemistry.
organolead-trihalide-top-vie
Cross-sectional SEM image of organolead trihalide perovskite thin films
Image: Kianoosh Poorkazem and Dr. Timothy Kelly, USask Dept. of Chemistry. 
cross-section-sem
Top view (SEM image) of organolead trihalide perovskite thin films. 
Image: Kianoosh Poorkazem and Dr. Timothy Kelly, USask Dept. of Chemistry.